氏名

シノハラ ヒロフミ

篠原 尋史

職名

特任教授 (https://researchmap.jp/7000012046/)

所属

(大学院情報生産システム研究科)

連絡先

URL等

研究者番号
50531810

本属以外の学内所属

学内研究所等

理工学術院総合研究所(理工学研究所)

兼任研究員 2018年-

学歴・学位

学位

博士

外部研究資金

科学研究費採択状況

研究種別:

初期状態設定によるセキュリティー用自然由来データの高品質化の研究

2017年-0月-2020年-0月

配分額:¥4810000

学内研究制度

特定課題研究

IoTセキュリティーのための集積回路研究

2015年度

研究成果概要:Secure LSI is a key technology to protect growing IoT from hacking. In this research, its prime building blocks PUF...Secure LSI is a key technology to protect growing IoT from hacking. In this research, its prime building blocks PUF (Physical Unclonable Function) and TRNG (True Random Number Generator) are focused. Device variation and noise plays important rolls in both circuits. To obtain fundamental data on them and to evaluate SRAM based PUF, a test chip has been designed in 180nm CMOS. The design data has been taped out to VDEC and is now under fabrication. The test chip consists of following circuits.(1) nMOS and pMOS transistors array: Statistic data of devise variations and noises are obtained from this test circuit.(2) SRAM based PUFs: Seven types of SRAM based PUFs are integrated on the chip. By comparing characteristics of them, effects of device variation and noise on operation stability will be made clear. This data can also be utilized to predict the randomness of TRNG.  Furthermore, a new PUF circuit and a new TRNG circuit for stable operation and low power are thought-up, and their basic operations are verified by circuit simulations using SPICE.

素子ばらつきを用いたセキュリティーチップにおける組み込み自動テストの研究

2016年度

研究成果概要:Build-in self test(BIST) of PUF (Physical Unclonable Function) is researched. Generally outputdata is compared with...Build-in self test(BIST) of PUF (Physical Unclonable Function) is researched. Generally outputdata is compared with the expected data in test. However, there is no expecteddata for PUF. Furthermore, don’t read the PUF output data to outside thechip is preferred for higher security. Thus BIST is very important for PUF. In PUF BIST, following three items must betested: a) Randomness (randomness of each output data), b) Reproducibility(output data is always same), c) Uniqueness (output data differs each other).In this year we focused to a) and b). a) Randomness test: Our SRAM PUFs aretested by NIST SP800-22 randomness test and autocorrelation Rxx(j)is also evaluated. The PUFs passed all 13 NIST test items except for 2 items wheredata length was not long enough. Distribution of Rxx(j) was also withinreasonable range.b) Reproducibility test: In order toaccelerate the degradation of reproducibility by temperature change or longtime use, our strategy is to add disturb during data evaluation. As a firststep, SRAM PUF with pair VSS terminals are designed. By adding small bias tothe terminals, it has been confirmed that this structure work well forthe acceleration.

素子ばらつきを用いたセキュリティーチップの低エネルギー化と動作安定化の研究

2016年度

研究成果概要:Secure LSI is akey technology to protect growing IoT from hacking. In this research, its primebuilding block PUF (P...Secure LSI is akey technology to protect growing IoT from hacking. In this research, its primebuilding block PUF (Physical Unclonable Function) is focused. Test chip hasbeen designed and fabricated in 180nm CMOS using VDEC shuttle service. Testcircuits and measurement results are as follows. (1) nMOS and pMOStransistors array: It has 5 types of nMOS FETs and 3 types of pMOS transistors eachof them is repeated 16 times. Drain current of each transistor can be measured independently. Vth random variation of each type of MOS FETis evaluated by measuring 5 chips. And Perglom’sconstant Avt are derived for nMOS FET and for pMOS FET. (2) SRAM PUFs:Eight SRAM PUFs with different bit cell FET sizes are integrated on the chip. Bit error rate (BER) of the PUFs aremeasured by evaluating the output data 500 times each. Measured BERs arecompared and discussed, and effects of device mismatch and noise on BER hasbeen made clear. NBTI (Negative BiasTemperature Instability) electric stress is imposed to one of the  PUF, and BER was reduced from 3.23% to 0%. 

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